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    Cold Field Scanning Electron Microscope (CF-SEM)
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    Update time: 2009-09-16
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    Cold Field Scanning Electron Microscope (CF-SEM) 

    Model: S-4800 (Hitachi High-Technologies Corporation)

    Technical Features

    •  Resolution:1.4 nm at 1 kV; 1.0 nm at 15 kV
    •  Electron gun: Cold field electron source
    •  Acceleration voltage: 0.5 ~ 30kV
    •  Magnification: ×20 ~×800,000
    •  Detector: Upper/lower secondary electron detector
    •  Accessory: X-ray energy spectrometer
     
    APPLICATIONS  

    Mainly used for surface topography observation and element analysis of living organisms, macromolecules, inorganic nonmetallic and metallic materials; widely used in many fields such as biology, energy, material, chemical, environment, etc.

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